Bonding process with inhibited oxide formation

ABSTRACT

First and second contacts are formed on first and second wafers from disparate first and second conductive materials, at least one of which is subject to surface oxidation when exposed to air. A layer of oxide-inhibiting material is disposed over a bonding surface of the first contact and the first and second wafers are positioned relative to one another such that a bonding surface of the second contact is in physical contact with the layer of oxide-inhibiting material. Thereafter, the first and second contacts and the layer of oxide-inhibiting material are heated to a temperature that renders the first and second contacts and the layer of oxide-inhibiting material to liquid phases such that at least the first and second contacts alloy into a eutectic bond.

PRIORITY, CROSS-REFERENCES, INCORPORATION BY REFERENCE

This application is a divisional of U.S. patent application Ser. No. 16/702,783 filed Dec. 4, 2019, which is a divisional of U.S. patent application Ser. No. 16/222,939 filed Dec. 17, 2018 (now U.S. patent Ser. No. 10/541,224), which is a divisional of U.S. patent application Ser. No. 15/709,371 filed Sep. 19, 2017 (now U.S. patent Ser. No. 10/192,850), which claims priority to U.S. Provisional Patent Application No. 62/396,817 filed Sep. 19, 2016. Each of the above-identified applications is hereby incorporated by reference.

TECHNICAL FIELD

The present disclosure relates to semiconductor wafer-to-wafer, die-to-wafer and die-to-die bonding.

BACKGROUND

In a solder system containing aluminum on one side, as in the case of a CMOS wafer, the problem exists of rapid native oxidation of the aluminum surface—forming an oxide layer that can impede solder bonding generally, and wafer-to-wafer bonding in particular. Common methods used to combat the oxide formation include pre-bond cleaning (plasma, chemical), high force during bonding (breaking the oxide), and gas treatment prior to bonding (forming gas at temperature), all of which add complexity and cost to the bonding operation.

DRAWINGS

The various embodiments disclosed herein are illustrated by way of example, and not by way of limitation, in the figures of the accompanying drawings and in which like reference numerals refer to similar elements and in which:

FIG. 1 contrasts a conventional, oxide-plagued bonding approach with an exemplary oxide-inhibited bonding technique;

FIG. 2 illustrates a variety of materials that may be used to enable oxide-inhibited bonding of counterpart substrates;

FIG. 3 illustrates the same bonding materials as FIG. 2, but with oxide-inhibitant disposed on the bonding surfaces on both counterpart substrates; and

FIG. 4 illustrates the optional bonding materials of FIG. 2 (Al, AlSi, AlSiCu) disposed on counterpart substrates and capped with silver oxide inhibitant rather than the gold oxide inhibitant shown in prior drawing figures.

DETAILED DESCRIPTION

In various embodiments herein, bonding surface(s) of conductive contacts deposited or otherwise formed on a wafer or die is capped with another material to inhibit (or prevent, limit or control) the oxidation of the bonding surface. By using a capping material that does not oxidize or has an easier to remove oxide, steps commonly used to remove undesired oxide can be reduced or eliminated from the bonding process. In particular, bonding can be performed at substantially lower force which advantageously lessens relative movement of the precisely-aligned substrates during wafer bonding, flowing of the solder during liquidus, etc.

Materials that may be used for capping the aluminum layer include, for example and without limitation, the family of noble materials (e.g., rhenium, ruthenium, rhodium, palladium, silver, osmium, iridium, platinum, gold, etc. and various alloys thereof) and other materials such as copper, titanium, nickel, indium, tin, and zinc. Materials that form some oxide, but are softer than aluminum are also useful as lower force can be used to cause mechanical deformation and thereby expose un-oxidized material at the bonding surface of the contact.

In one embodiment, the capping material is deposited on the aluminum in an environment that is free of oxidation (e.g., in the same chamber, or multiple deposition chambers connected by a common vacuum chamber), or in a chemical environment such as a plating bath, etc. in which oxidation is removed as part of the process. Where oxide removal is not inherent in the inhibitant disposition process, any exposure of the bonding surface to an oxidizing environment is limited in time and/or concentration (i.e., limited concentration of oxidizing agents) such that the exposed contact surface remains primarily that of the bonding surface material (e.g., aluminum, aluminum alloy, etc.) In yet other embodiments, the substrate with aluminum or other oxidation-prone bonding surface is further processed, and then later cleaned (for example in a sputter etch) to remove the oxide before depositing the capping material (again, with limited pre-capping exposure to an oxidizing environment) to form a final structure with a layer of aluminum (including any of various aluminum alloys) and the capping material.

In practice, the capping material is chosen for compatibility with the overall requirements of the intended solder bond. For example, in the case of a binary eutectic (two materials forming a eutectic bond), the capping material may form either with the aluminum alloy, or with the complementary substrate material, or both. The resulting ternary system (or quaternary, or higher material count system) is generally chosen to melt at a reasonable/tolerable temperature in view of the system elements, and to form a stable solder joint.

FIG. 1 contrasts a conventional, oxide-plagued bonding approach (relatively high force applied to break aluminum oxide) with an exemplary oxide-inhibited bonding technique in which aluminum contacts are capped with thin gold films to inhibit oxide formation and thereby enable formation of eutectic wafer-to-wafer (or die-to-wafer or die-to-die) bonds with substantially reduced applied force.

FIG. 2 illustrates a variety of materials that may be used to enable oxide-inhibited bonding of counterpart substrates 121 and 123. As shown, aluminum (optionally alloyed with trace to significant amounts of silicon and/or copper, for example) is disposed on substrate 121 and capped with an oxide inhibitant of Gold (e.g., 10-100 nm thick, though thicker or thinner films may be used), while silicon, germanium, or an alloy of both (SiGe) is disposed on the counterpart substrate 123. Any of the bonding materials on substrate 121 may be bonded with any of the bonding materials on substrate 123 to form a bond within a given system, and a diversity of bond types may exist within the same system. Substrates 121 and 123 may themselves be different wafers (e.g., two different CMOS wafers, a CMOS wafer and a microelectromechanical-system (MEMS) wafer, etc. to be singulated into individual dies after wafer-to-wafer bonding), different dies, or a die and a wafer. With respect to different wafer or die types (e.g., MEMS and CMOS), any of the bonding material pairs may be reversed in orientation from those depicted (e.g., Si/Ge/SiGe may be disposed on MEMS wafer or CMOS wafer) and a diversity of such orientations may exist within the same system. Also, either or both of substrates 121 and 123 may individually include one or more constituent substrates and/or other structural components (e.g., resonant MEMS structures, metal layers, oxide layers, vias, encapsulation chambers, etc.).

FIG. 3 illustrates the same bonding materials as FIG. 2, but with oxide-inhibitant (gold in the examples of FIGS. 2 and 3) disposed on the bonding surfaces on each of substrates 131 and 133. Thus, aluminum (or alloy) with a cap of gold is disposed on substrate 131, and silicon/germanium (one, the other, or alloy of the two) with a cap of gold is disposed on substrate 133. As in FIG. 3, any of the bonding materials on substrate 131 may be bonded with any of the bonding materials on substrate 133 to form a bond within a given system, and a diversity of bond types may exist within the same system. Also, substrates 131 and 133 may be different wafers (e.g., two different CMOS wafers, a CMOS wafer and a microelectromechanical-system (MEMS) wafer, etc. to be singulated into individual dies after wafer-to-wafer bonding), different dies, or a die and a wafer, and either or both of substrates 131 and 133 may individually include one or more constituent substrates and/or other structural components (e.g., resonant MEMS structures, vias, encapsulation chambers, etc.). With respect to different wafer or die types (e.g., MEMS and CMOS), any of the bonding material pairs may be reversed in orientation from those depicted (e.g., Si/Ge/SiGe may be disposed on MEMS wafer or CMOS wafer) and a diversity of such orientations may exist within the same system.

Despite the gold-cap oxide inhibitant shown in FIGS. 2 and 3, any of the depicted bonding surfaces/materials may be capped with oxide inhibitants other than gold. FIG. 4, for example, illustrates the bonding materials of FIG. 2 (Al, AlSi, AlSiCu) disposed on counterpart substrates 141 and 143 and capped with oxide inhibitants of silver instead of gold. The counterpart bonding surfaces may similarly be capped with silver instead of gold (i.e., arrangement shown in FIG. 3, but with silver inhibitant instead of gold).

In general, oxide-inhibited bonding processes according to the techniques shown and described herein involve substrate alignment (e.g., wafer alignment in a wafer bond, singulated die alignment in a die-to-die bond), substrate-to-substrate contact with varying degrees of force (including a force ramp), and then elevation (e.g., ramp) to at least a first temperature where particular binary combinations reach liquidus (for example, a temperature at which silicon with gold cap reaches liquidus). Depending on the choice of materials, the ternary or larger combination may reach liquidus upon elevation to the first temperature, or, if not, further elevation to a second temperature and possibly additional elevations to third, or higher temperature targets are carried out to achieve liquidus of the ternary (or quaternary, etc.) system. In embodiments having multiple different liquidus temperatures, elevation to each temperature may be accompanied by a pause of variable and/or controlled duration (i.e., plateau at a particular temperature) before commencing further elevation toward the higher temperature (plateau). In an alternative embodiment having multiple liquidus temperatures, the temperature may be raised directly to a higher than eutectic temperature which might be useful in achieving certain alloy compositions. In another embodiment, prior to substrate alignment and bonding, one or both wafers are heated to one or more predetermined temperatures to alloy the oxide-inhibiting material with the conductive material that constitutes the underlying contact. In general, heating to a single alloy-forming temperature (“alloying temperature”) is sufficient where oxide-inhibitant is disposed over the bonding surfaces of only one of the counterpart wafers or where a single temperature setpoint is sufficient to alloy respective dispositions of oxide-inhibitant and underlying contacts on both of counterpart wafers. Conversely, where alloying temperatures of oxide-inhibitant and underlying contacts are substantially different with respect to counterpart wafers, each wafer may be separately heated to a respective alloying temperature. Any or all of the alloying temperatures may be higher or lower than the eutectic bonding temperature. Also, in all cases, temperature elevation for alloying or bonding purposes may be monotonic (until eventual cool down) or may be characterized by one or more valleys or inflections.

In the foregoing description and in the accompanying drawings, specific terminology and drawing symbols have been set forth to provide a thorough understanding of the disclosed embodiments. In some instances, the terminology and symbols may imply specific details that are not required to practice those embodiments. The term “contact” herein generally refers to a conductive material that makes up part of a conductive bond, though “physical contact” refers to physical touching—a distinction generally clear from context. “Contact interface” refers to a bond interface. The terms “exemplary” and “embodiment” are used to express an example, not a preference or requirement. Also, the terms “may” and “can” are used interchangeably to denote optional (permissible) subject matter. The absence of either term should not be construed as meaning that a given feature or technique is required.

Various modifications and changes can be made to the embodiments presented herein without departing from the broader spirit and scope of the disclosure. For example, features or aspects of any of the embodiments can be applied in combination with any other of the embodiments or in place of counterpart features or aspects thereof. Accordingly, the specification and drawings are to be regarded in an illustrative rather than a restrictive sense. 

What is claimed is:
 1. An integrated circuit having a cavity to support a microelectromechanical systems (MEMS) device, the integrated circuit comprising: a first substrate having a plurality of first electrical contacts, wherein the first electrical contacts comprise aluminum; a second substrate having a plurality of second electrical contacts, wherein the second electrical contacts comprise a layer of a conductive material; wherein the first substrate and the second substrate are bonded together in a manner where the first electrical contacts are aligned with and electrically coupled with respective ones of the second electrical contacts, and in a manner such that the cavity is defined between the first substrate and the second substrate; and a eutectic bond layer interfacing each of the first electrical contacts with the respective second electrical contact; and wherein the eutectic bond layer is formed at least in part by metal from an oxide-inhibiting capping layer from a surface of the first electrical contacts, the oxide-inhibiting capping layer being softer than the aluminum and softer than the layer of the conductive material at a temperature used to form the eutectic bond layer.
 2. The integrated circuit of claim 1 wherein the metal from the oxide-inhibiting capping layer from the surface of the first electrical contacts comprises gold.
 3. The integrated circuit of claim 1 wherein the metal from the oxide-inhibiting capping layer from the surface of the first electrical contacts comprises silver.
 4. The integrated circuit of claim 1 wherein at least one of the first electrical contacts comprises an alloy of aluminum and copper.
 5. The integrated circuit of claim 1 wherein at least one of the first electrical contacts comprises an alloy of aluminum, silicon and copper (AlSiCu).
 6. The integrated circuit of claim 1 wherein at least one of the second electrical contacts comprises silicon.
 7. The integrated circuit of claim 1 wherein at least one of the second electrical contacts comprises germanium.
 8. The integrated circuit of claim 1 wherein the first substrate is bonded to the second substrate so as to encapsulate the cavity.
 9. The integrated circuit of claim 1 wherein the eutectic bond layer comprises titanium.
 10. The integrated circuit of claim 1 wherein the eutectic bond layer comprises at least one of rhenium, ruthenium, rhodium, palladium, silver, osmium, iridium, platinum, gold, copper, titanium, nickel, indium, tin and zinc, and wherein the eutectic bond layer is no more than 100 nanometers thick.
 11. The integrated circuit of claim 1 wherein the eutectic bond layer is characterized as having a first alloy formed by a first eutectic combination formed at a first temperature at least in part from the oxide-inhibiting capping layer from the surface of the first electrical contacts, and a second eutectic combination formed at a second temperature at least in part from oxide-inhibiting capping layer from the surface of the second electrical contacts.
 12. The integrated circuit of claim 1 wherein one of the first substrate and the second substrate is provided by a MEMS wafer and the other of the first substrate and the second substrate is provided by a complementary metal oxide semiconductor (CMOS) wafer.
 13. The integrated circuit of claim 1 wherein the eutectic bond layer comprises an alloy of at least three metals.
 14. The integrated circuit of claim 1 wherein the plurality of first electrical contacts and the plurality of second electrical contacts are to provide for electrical connections for a MEMS resonant structure.
 15. A method of forming an integrated circuit having a cavity to support a microelectromechanical systems (MEMS) device, the method comprising: providing a first substrate having a plurality of first electrical contacts, wherein the first electrical contacts comprise aluminum and an oxide-inhibiting capping layer on a surface of the first electrical contacts; providing a second substrate having a plurality of second electrical contacts, wherein the second electrical contacts comprise a layer of conductive material; bonding the first substrate and the second substrate together in a manner where the first electrical contacts are aligned with and electrically coupled with respective ones of the second electrical contacts, such that the cavity is defined between the first substrate and the second substrate and such that a eutectic bond layer interfaces each of the first electrical contacts with the respective second electrical contact; wherein the eutectic bond layer is formed at least in part by metal from an oxide-inhibiting capping layer from a surface of the first electrical contacts, and wherein the oxide-inhibiting capping layer is softer than the aluminum and softer than the metal layer of the second electrical contacts at a temperature used to form the eutectic bond layer.
 16. The method of claim 15 further comprising forming the eutectic bond layer to have gold.
 17. The method of claim 15 further comprising forming the eutectic bond layer as an alloy of at least three metals.
 18. The method of claim 15 wherein bonding comprises heating the eutectic bond layer to at least two different temperatures, including a first temperature to form a first eutectic combination, and a second temperature to form a second eutectic combination.
 19. An integrated circuit having a cavity to support a microelectromechanical systems (MEMS) device, the integrated circuit comprising: a first substrate having a plurality of first electrical contacts, wherein the first electrical contacts comprise aluminum; a second substrate having a plurality of second electrical contacts, wherein the second electrical contacts comprise a layer of a conductive material having at least one of silicon and germanium; wherein the first substrate and the second substrate are bonded together in a manner where the first electrical contacts are aligned with and electrically coupled with respective ones of the second electrical contacts to as to provide electrical connections for the MEMS device, and in a manner such that the cavity is encapsulated between the first substrate and the second substrate; and a eutectic bond layer interfacing each of the first electrical contacts with the respective second electrical contact, the eutectic bond layer comprising gold; wherein the eutectic bond layer is formed at least in part by metal from an oxide-inhibiting capping layer from a surface of the first electrical contacts, the oxide-inhibiting capping layer being softer than the aluminum and softer than the layer of the conductive material at a temperature used to form the eutectic bond layer.
 20. The integrated circuit of claim 19 wherein at least one of the first electrical contacts comprises an alloy of aluminum and copper.
 21. The integrated circuit of claim 19 wherein at least one of the first electrical contacts comprises an alloy of aluminum, silicon and copper (AlSiCu).
 22. The integrated circuit of claim 19 wherein the eutectic bond layer is no more than 100 nanometers thick.
 23. The integrated circuit of claim 19 wherein the eutectic bond layer is characterized as having a first alloy formed by a first eutectic combination formed at a first temperature at least in part from the gold, and a second eutectic combination formed at a second temperature at least in part from gold.
 24. The integrated circuit of claim 19 wherein the eutectic bond layer comprises an alloy of at least three metals. 